High Resolution Optical Frequency Domain Reflectometry for Analyzing Intra-Chip Reflections
نویسندگان
چکیده
منابع مشابه
High resolution optical frequency domain reflectometry for characterization of components and assemblies.
We describe a technique for polarization sensitive optical frequency domain reflectometry (OFDR) that achieves 22 micrometer two-point spatial resolution over 35 meters of optical length with -97 dB sensitivity in a single measurement taking only seconds. We demonstrate OFDR's versatility in both time- and frequency-domain metrology by analyzing a fiber Bragg grating (FBG) in both the spectral ...
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Optical time-domain reflectometry (OTDR), originally developed by Barnoski and Jensen in 1976 [1], is now a well-established tool for non-destructive characterization of optical networks and components. In general an ideal reflectometry system would have a spatial resolution high enough to locate closely separated sites of reflection within the network under test. In addition the sensitivity wo...
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ژورنال
عنوان ژورنال: IEEE Photonics Technology Letters
سال: 2017
ISSN: 1041-1135,1941-0174
DOI: 10.1109/lpt.2017.2723242